Si K Edge Measurements of the ISM with Chandra
Abstract
The Si K edge structure in X-ray spectra of the diffuse ISM is expected to exhibit substructure related to the fact that most absorption is due to silicates in dust. We surveyed high resolution X-ray spectra of a large number of bright low-mass X-ray binaries with column densities significantly larger than 10^22 cm^2. Using the to date unprecedented spectral resolution of the high energy transmission gratings onboard the Chandra X-ray observatory we find complex substructure in the Si K edge. The highest resolved spectra show two edges, one at the expected value for atomic, one at the value for most silicate compounds with the dominant contribution of the latter. There is specific subtructure from silicate optical depth caused by absorption and scattering. Some is also variable and can be attributed to ionized absorption in the vicinity of the X-ray sources.
- Publication:
-
American Astronomical Society Meeting Abstracts #227
- Pub Date:
- January 2016
- Bibcode:
- 2016AAS...22743605S